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About this scholarly article
Impact of crystallization behavior of SrxTiyOz films on electrical properties of metal-insulator-metal capacitors with TiN electrodes by Pawlak, M. A.; Kaczer, B.; Kim, M.-S.; Popovici, M.; Tomida, K.; Swerts, J.; Opsomer, K.; Polspoel, W.; Favia, P.; Vrancken, C.; Demeurisse, C.; Wang, W.-C.; Afanas’ev, V. V.; Vandervorst, W.; Bender, H.; Debusschere, I.; Altimime, L.; Kittl, J. A. is a scholarly article available to read on EtoBox.
- Author
- Pawlak, M. A.; Kaczer, B.; Kim, M.-S.; Popovici, M.; Tomida, K.; Swerts, J.; Opsomer, K.; Polspoel, W.; Favia, P.; Vrancken, C.; Demeurisse, C.; Wang, W.-C.; Afanas’ev, V. V.; Vandervorst, W.; Bender, H.; Debusschere, I.; Altimime, L.; Kittl, J. A.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2010