About this scholarly article

The Effect of Assembly Bias on Redshift-space Distortions by Padilla, N; Contreras, S; Zehavi, I; Baugh, C M; Norberg, P is a scholarly article available to read on EtoBox.

Author

Padilla, N; Contreras, S; Zehavi, I; Baugh, C M; Norberg, P

Publisher

John Wiley and Sons; Oxford University Press; Oxford University Press (OUP) (ISSN 0035-8711)

Published

2019