About this scholarly article

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Monday 18 September 2000)] Challenges in Process Integration and Device Technology - Laser-induced structure defects and their use for modification of properties of (Cd,Hg)Te epitaxial layers end CdTe cyrstals by Zaginey, Apollinariy; Kotlyarchuk, Bohdan K.; Syvenkyy, Yuriy; Burnett, David; Kimura, Shin'ichiro; Singh, Bhanwar is a scholarly article available to read on EtoBox.

Author

Zaginey, Apollinariy; Kotlyarchuk, Bohdan K.; Syvenkyy, Yuriy; Burnett, David; Kimura, Shin'ichiro; Singh, Bhanwar

Publisher

SPIE

Published

2000