About this scholarly article

2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Performance and reliability of a 65nm Flash based FPGA by Jia, James Yingbo; Singaraju, Pavan; Dhaoui, Fethi; Newell, Rich; Liu, Patty; Micael, Habtom; Traas, Michael; Sammie, Salim; Hawley, Frank; McCollum, John; den Abeelen Werner, Van is a scholarly article available to read on EtoBox.

Author

Jia, James Yingbo; Singaraju, Pavan; Dhaoui, Fethi; Newell, Rich; Liu, Patty; Micael, Habtom; Traas, Michael; Sammie, Salim; Hawley, Frank; McCollum, John; den Abeelen Werner, Van

Publisher

IEEE

Published

2012