About this scholarly article

2013 IEEE International Reliability Physics Symposium (IRPS) - Statistical outlier screening for latent defects by Tikkanen, J.; Sumikawa, N.; Wang, L.; Winemberg, L.; Abadir, M. S. is a scholarly article available to read on EtoBox.

Author

Tikkanen, J.; Sumikawa, N.; Wang, L.; Winemberg, L.; Abadir, M. S.

Publisher

IEEE

Published

2013