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About this Physics and Astronomy article
Reflection-based Near-field Ellipsometry for Thin Film Characterization by Liu, Zhuang; Zhang, Ying; Kok, Shaw Wei; Ng, Boon Ping; Soh, Yeng Chai is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Liu, Zhuang; Zhang, Ying; Kok, Shaw Wei; Ng, Boon Ping; Soh, Yeng Chai
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-3991)
- Published
- 2013
- Field
- Physics and Astronomy (Physical Sciences)
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