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This document discusses quantitative methods for measuring microstructural parameters. There are two main types of measurements - measurements of depths or thicknesses at surfaces, and stereological measurements that describe relationships between 2D and 3D microstructural features. Common stereological measurements include point counts, line intercepts, and area and particle counts within defined measurement areas. Simple counting measurements like point fractions and number of intercepts per unit length a

Author

betelguese

Language

EN