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About this Engineering article
Remaining Useful Life Prediction for Fractional Degradation Processes Under Varying Modes by Xi, Xiaopeng; Zhou, Donghua; Chen, Maoyin; Balakrishnan, Narayanaswamy is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Xi, Xiaopeng; Zhou, Donghua; Chen, Maoyin; Balakrishnan, Narayanaswamy
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley-Blackwell; Wiley (ISSN 0008-4034)
- Published
- 2019
- Field
- Engineering (Physical Sciences)
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