About this scholarly article

International Symposium on Quality Electronic Design (ISQED) - Flexible data allocation for scratch-pad memories to reduce NBTI effects by Papagiannopoulou, D.; Prasertsom, P.; Bahar, I. is a scholarly article available to read on EtoBox.

Author

Papagiannopoulou, D.; Prasertsom, P.; Bahar, I.

Publisher

IEEE

Published

2013

Language

EN