About this scholarly article

2014 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Failure Analysis of Virtual and Physical Machines: Patterns, Causes and Characteristics by Birke, Robert; Giurgiu, Ioana; Chen, Lydia Y.; Wiesmann, Dorothea; Engbersen, Ton is a scholarly article available to read on EtoBox.

Author

Birke, Robert; Giurgiu, Ioana; Chen, Lydia Y.; Wiesmann, Dorothea; Engbersen, Ton

Publisher

IEEE

Published

2014

Language

EN