About this scholarly article

SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Ray Imaging II - Soft X-ray Imaging System for Measurement of Noncircular Tokamak Plasmas by Fonck, R. J.; Reusch, M.; Jaehnig, K. P.; Hulse, R.; Roney, P.; Bowen, D. Keith; Knight, Larry V. is a scholarly article available to read on EtoBox.

Author

Fonck, R. J.; Reusch, M.; Jaehnig, K. P.; Hulse, R.; Roney, P.; Bowen, D. Keith; Knight, Larry V.

Publisher

SPIE

Published

1986