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About this Engineering article
Quantification of High Resolution Pulsed RF GDOES Depth Profiles for Mo/B4C/Si Nano-Multilayers by Yang, Hao (author);Lian, Songyou (author);Chapon, Patrick (author);Song, Yibing (author);Wang, Jiangyong (author);Xu, Congkang (author) is a Engineering article available to read on EtoBox.
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- Author
- Yang, Hao (author);Lian, Songyou (author);Chapon, Patrick (author);Song, Yibing (author);Wang, Jiangyong (author);Xu, Congkang (author)
- Publisher
- MDPI AG
- Published
- 2021
- Field
- Engineering (Physical Sciences)