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Anomalous X-ray Scattering For Materials Characterization: Atomic-scale Structure Determination (springer Tracts In Modern Physics) by Yoshio Waseda (auth.) is a engineering available to read on EtoBox.
What is Anomalous X-ray Scattering For Materials Characterization: Atomic-scale Structure Determination (springer Tracts In Modern Physics) about?
The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interest
Who reads Anomalous X-ray Scattering For Materials Characterization: Atomic-scale Structure Determination (springer Tracts In Modern Physics)?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- Yoshio Waseda (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Published
- 2002
- Language
- EN
- ISBN
- 9783540460084
- Category
- engineering
- Subjects
- Science, Technology, Engineering
- Updated
- 2026-03-25
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