About this scholarly article

1998 High-Temperature Electronic Materials, Devices and Sensors Conference (Cat. No.98EX132) - Reliability concerns in high temperature electronic systems by McCluskey, P.; Grybowski, R.R.; Condra, L.; Das, D.; Fink, J.; Jordan, J.; Torri, T. is a scholarly article available to read on EtoBox.

Author

McCluskey, P.; Grybowski, R.R.; Condra, L.; Das, D.; Fink, J.; Jordan, J.; Torri, T.

Publisher

IEEE

Published

1998