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Integration of Micro Resistance Thermometer Detectors in AlGaN/GaN Devices by Arenas, Osvaldo; Al Alam, Elias; Thevenot, Alexandre; Cordier, Yvon; Jaouad, Abdelatif; Aimez, Vincent; Maher, Hassan; Ares, Richard; Boone, Francois is a Engineering article available to read on EtoBox.

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Author
Arenas, Osvaldo; Al Alam, Elias; Thevenot, Alexandre; Cordier, Yvon; Jaouad, Abdelatif; Aimez, Vincent; Maher, Hassan; Ares, Richard; Boone, Francois
Publisher
Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers Inc.; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 2168-6734)
Published
2014
Language
EN
Field
Engineering (Physical Sciences)