About this scholarly article

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) - Defects Effect on InAlAs/InGaAs High Electron Mobility Transistors by Sun, Shu-Xiang; Chang, Ming-Ming; Zhong, Ying-Hui; Li, Yu-Xiao; Ding, Peng; Jin, Zhi is a scholarly article available to read on EtoBox.

Author

Sun, Shu-Xiang; Chang, Ming-Ming; Zhong, Ying-Hui; Li, Yu-Xiao; Ding, Peng; Jin, Zhi

Publisher

IEEE

Published

2018