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About this Mathematics article
An Extended Sequential Goodness-of-fit Multiple Testing Method for Discrete Data by Castro-Conde, I.; Dohler, S.; de Una-Alvarez, J. is a Mathematics article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Mathematics.
- Author
- Castro-Conde, I.; Dohler, S.; de Una-Alvarez, J.
- Publisher
- SAGE Publications (ISSN 0962-2802)
- Published
- 2015
- Field
- Mathematics (Physical Sciences)
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