About this scholarly article

2020 IEEE Silicon Nanoelectronics Workshop (SNW) - Charge-assisted Recovery and Degradation in Charge-trapping 3D NAND Flash Memory, Experimental Evidences and Theoretical Perspectives by Ma, Xiaolei; Cao, Rui; Wang, Fei; Zhan, Xuepeng; Chen, Jiezhi is a scholarly article available to read on EtoBox.

Author

Ma, Xiaolei; Cao, Rui; Wang, Fei; Zhan, Xuepeng; Chen, Jiezhi

Publisher

IEEE

Published

2020