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About this scholarly article
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) - Fault simulation and response compaction in full scan circuits using HOPE by Das, S.R.; Assaf, M.H.; Petriu, E.M.; Jone, W.-B. is a scholarly article available to read on EtoBox.
- Author
- Das, S.R.; Assaf, M.H.; Petriu, E.M.; Jone, W.-B.
- Publisher
- IEEE
- Published
- 2002
- Language
- EN
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