About this scholarly article

Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Comprehensive modeling of VLSI test by Ziaja, T.; Swartzlander, E. is a scholarly article available to read on EtoBox.

Author

Ziaja, T.; Swartzlander, E.

Publisher

IEEE Comput. Soc. Press

Published

1996