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About this scholarly article
2012 IEEE Conference on Computer Vision and Pattern Recognition - Metric learning with two-dimensional smoothness for visual analysis by Xinlei Chen, ; Zifei Tong, ; Haifeng Liu, ; Deng Cai, is a scholarly article available to read on EtoBox.
- Author
- Xinlei Chen, ; Zifei Tong, ; Haifeng Liu, ; Deng Cai,
- Publisher
- IEEE
- Published
- 2012
- Language
- EN
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