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About this Engineering article
Influence of Dots Size and Dots Number Fluctuations on the Electrical Characteristics of Multi-nanocrystal Memory Devices by L. Perniola; B. D Salvo; G. Ghibaudo; A. Foglio Para; G. Pananakakis; T. Baron; S. Lombardo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- L. Perniola; B. D Salvo; G. Ghibaudo; A. Foglio Para; G. Pananakakis; T. Baron; S. Lombardo
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)
- Published
- 2003
- Language
- EN
- Field
- Engineering (Physical Sciences)