Opening book details…
About this scholarly article
Abstract: Effect of microstructure on interdiffusion in bimetallic Cu–Ni thin films by Johnson, B. C. is a scholarly article available to read on EtoBox.
- Author
- Johnson, B. C.
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0022-5355)
- Published
- 1979
- Language
- EN