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About this Engineering article
Intrinsic Tolerance to Total Ionizing Dose Radiation in Gate-All-Around MOSFETs by Comfort, Everett S.; Rodgers, Martin P.; Allen, William; Gausepohl, Steve C.; Zhang, Enxia X.; Alles, Michael L.; Hughes, Harold L.; McMarr, Patrick J.; Lee, Ji Ung is a Engineering article available to read on EtoBox.
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- Author
- Comfort, Everett S.; Rodgers, Martin P.; Allen, William; Gausepohl, Steve C.; Zhang, Enxia X.; Alles, Michael L.; Hughes, Harold L.; McMarr, Patrick J.; Lee, Ji Ung
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)