About this scholarly article

2020 IEEE Engineering International Research Conference (EIRCON) - Defect Detection on Andean Potatoes using Deep Learning and Adaptive Learning by De La Cruz Casano, Celso; Catano Sanchez, Miguel; Rojas Chavez, Freddy; Vicente Ramos, Wagner is a scholarly article available to read on EtoBox.

Author

De La Cruz Casano, Celso; Catano Sanchez, Miguel; Rojas Chavez, Freddy; Vicente Ramos, Wagner

Publisher

IEEE

Published

2020