About this scholarly article

SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition - A simple and efficient object detection method based on saliency measure for infrared radiation image by Sharma, Gaurav; Zhou, Fugen; Liu, Jennifer; Sun, Zhaolei; Hui, Bin is a scholarly article available to read on EtoBox.

Author

Sharma, Gaurav; Zhou, Fugen; Liu, Jennifer; Sun, Zhaolei; Hui, Bin

Publisher

SPIE

Published

2014