About this scholarly article

ECS Transactions - Fabrication and Characterization of High Resistivity SOI Wafers for RF Applications by Lederer, Dimitri C.; Roda Neve, Cesar; Olbrechts, Benoit; Raskin, Jean-Pierre is a scholarly article available to read on EtoBox.

Author

Lederer, Dimitri C.; Roda Neve, Cesar; Olbrechts, Benoit; Raskin, Jean-Pierre

Publisher

ECS

Published

2008

Language

EN