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About this Engineering article
Spectroscopic ellipsometry of strained Si1-x Gex layers by M. Líbezný; J. Poortmans; M. Caymax; A. Van Ammel; J. Kuběna; V. Holý; J. Vanhellemont is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- M. Líbezný; J. Poortmans; M. Caymax; A. Van Ammel; J. Kuběna; V. Holý; J. Vanhellemont
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1993
- Language
- EN
- Field
- Engineering (Physical Sciences)