Skip to content

Opening book details…

About this Engineering article

Trimming Feature Extraction and Inference for MCU-Based Edge NILM: A Systematic Approach by Enrico Tabanelli; Davide Brunelli; Andrea Acquaviva; Luca Benini is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Enrico Tabanelli; Davide Brunelli; Andrea Acquaviva; Luca Benini
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Published
2022
Language
EN
Field
Engineering (Physical Sciences)

More by Enrico Tabanelli; Davide Brunelli; Andrea Acquaviva; Luca Benini

Browse all works by Enrico Tabanelli; Davide Brunelli; Andrea Acquaviva; Luca Benini