About this scholarly article

Proceedings of 2010 IEEE International Symposium on Circuits and Systems - An all-digital smart temperature sensor with auto-calibration in 65nm CMOS technology by Chung, Ching-Che; Yang, Cheng-Ruei is a scholarly article available to read on EtoBox.

Author

Chung, Ching-Che; Yang, Cheng-Ruei

Publisher

IEEE

Published

2010