About this scholarly article

SPIE Proceedings [SPIE Third International Conference on Thin Film Physics and Applications - Shanghai, China (Tuesday 15 April 1997)] Third International Conference on Thin Film Physics and Applications - Relationship between resistivity and temperature for Hg1-xCdxTe photoconductive detectors by Gui, Yongsheng; Zheng, Guozhen; Zhang, X. C.; Guo, Shaoling; Chu, Junhao; Cai, Yi; Zhou, Shixun; Wang, Yongling; Chen, Yi-Xin; Mao, Shuzheng is a scholarly article available to read on EtoBox.

Author

Gui, Yongsheng; Zheng, Guozhen; Zhang, X. C.; Guo, Shaoling; Chu, Junhao; Cai, Yi; Zhou, Shixun; Wang, Yongling; Chen, Yi-Xin; Mao, Shuzheng

Publisher

SPIE

Published

1998