About this scholarly article

2015 International Conference on IC Design & Technology (ICICDT) - Off-state stress degradation mechanism on advanced p-MOSFETs by Cho, Moonju; Spessot, Alessio; Kaczer, Ben; Aoulaiche, Marc; Ritzenthaler, Romain; Schram, Tom; Fazan, Pierre; Horiguchi, Naoto; Linten, Dimitri is a scholarly article available to read on EtoBox.

Author

Cho, Moonju; Spessot, Alessio; Kaczer, Ben; Aoulaiche, Marc; Ritzenthaler, Romain; Schram, Tom; Fazan, Pierre; Horiguchi, Naoto; Linten, Dimitri

Publisher

IEEE

Published

2015

Language

EN