About this scholarly article

2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207) - Investigation of SOI sensitivity to SEU-Influence of the buried oxide coupling effect by Colladant, T.; Ferlet-Cavrois, V.; L'Hoir, A.; Baggio, J.; Faynot, O. is a scholarly article available to read on EtoBox.

Author

Colladant, T.; Ferlet-Cavrois, V.; L'Hoir, A.; Baggio, J.; Faynot, O.

Publisher

IEEE

Published

2001