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About this Engineering article
Characteristic Length of Hot-electron Transport in Silicon Metal–oxide–semiconductor Field-effect Transistors by Sakamoto, T.; Kawaura, H.; Baba, T.; Iizuka, T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sakamoto, T.; Kawaura, H.; Baba, T.; Iizuka, T.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2000
- Field
- Engineering (Physical Sciences)
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