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About this Engineering article
Growth mechanism of Si nanowhiskers and SiGe heterostructures in Si nanowhiskers: X-ray scattering and electron microscopy investigations by Dujardin, R.; Poydenot, V.; Devillers, T.; Favre-Nicolin, V.; Gentile, P.; Barski, A. is a Engineering article available to read on EtoBox.
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- Author
- Dujardin, R.; Poydenot, V.; Devillers, T.; Favre-Nicolin, V.; Gentile, P.; Barski, A.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2006
- Field
- Engineering (Physical Sciences)