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About this Engineering article
De-embedding Coplanar Probes with Planar Distributed Standards by Williams, D.F.; Miers, T.H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Williams, D.F.; Miers, T.H.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9480)
- Published
- 1988
- Language
- EN
- Field
- Engineering (Physical Sciences)