About this scholarly article

2008 IEEE Pacific-Asia Workshop on Computational Intelligence and Industrial Application - Fabric Defect Detection Based on Wavelet Characteristics by Guan, Shengqi; Shi, Xiuhua; Cui, Haiying; Song, Yuqin is a scholarly article available to read on EtoBox.

Author

Guan, Shengqi; Shi, Xiuhua; Cui, Haiying; Song, Yuqin

Publisher

IEEE

Published

2008

Language

EN