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About this Engineering article
Assessment of the oxide-semiconductor interface in CCDs : D. R. Lamb, P. C. T. Roberts and Z. Dalieraki. Proc. Internepcon. Microelectron. p. 21 (October 1975) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1977
- Language
- EN
- Field
- Engineering (Physical Sciences)