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About this Engineering article
Scanning Auger microprobe investigation of segregation phenomena in Sn/Pb electronic contacts by W. F. L. Bogaerts; R. F. J. Straetmans; A. A. van Haute is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- W. F. L. Bogaerts; R. F. J. Straetmans; A. A. van Haute
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)
- Published
- 1986
- Language
- EN
- Field
- Engineering (Physical Sciences)
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