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About this Engineering article
X-ray reflectivity analysis of thin complex Langmuir-Blodgett films by P. Poloucek; U. Pietsch; T. Geue; C. Symietz; G. Brezesinski is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- P. Poloucek; U. Pietsch; T. Geue; C. Symietz; G. Brezesinski
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0022-3727)
- Published
- 2001
- Field
- Engineering (Physical Sciences)
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