Skip to content

Opening book details…

About this Engineering article

Point and Swirl Defects in Silicon by T. Okino; M. Onishi is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
T. Okino; M. Onishi
Publisher
Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
Published
1994
Language
EN
Field
Engineering (Physical Sciences)

More by T. Okino; M. Onishi

Browse all works by T. Okino; M. Onishi