About this scholarly article

The Proceedings of 2011 9th International Conference on Reliability, Maintainability and Safety - A model for predicting the obsolescence trend of FPGA by Gao, Cheng; Liu, Xiaozhang; Wang, Xiangfen is a scholarly article available to read on EtoBox.

Author

Gao, Cheng; Liu, Xiaozhang; Wang, Xiangfen

Publisher

IEEE

Published

2011

Language

EN