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About this Materials Science article
In-situ surface probe analysis for impurity flux in the heliotron-E device by T. Mizuuchi; O. Motojima; A. Iiyoshi; K. Uo; O. Machida; K. Nakayama; M. Hashiba; T. Satake; M. Mohri; T. Yamashina; S. Amemiya is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- T. Mizuuchi; O. Motojima; A. Iiyoshi; K. Uo; O. Machida; K. Nakayama; M. Hashiba; T. Satake; M. Mohri; T. Yamashina; S. Amemiya
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-3115)
- Published
- 1987
- Field
- Materials Science (Physical Sciences)