About this scholarly article

Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Analysis of dummy-gate dual-directional SCR (dSCR) device for ESD protection by Yuan Wang, ; Guangyi Lu, ; Jian Cao, ; Song Jia, ; Ganggang Zhang, ; Xing Zhang, is a scholarly article available to read on EtoBox.

Author

Yuan Wang, ; Guangyi Lu, ; Jian Cao, ; Song Jia, ; Ganggang Zhang, ; Xing Zhang,

Publisher

IEEE

Published

2013