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About this Engineering article
Investigation of Light-Induced Bias Instability in Hf-In-Zn-O Thin Film Transistors: A Cation Combinatorial Approach by Kwon, Jang-Yeon; Jung, Ji Sim; Son, Kyoung Seok; Lee, Kwang-Hee; Park, Joon Seok; Kim, Tae Sang; Park, Jin-Seong; Choi, Rino; Jeong, Jae Kyeong; Koo, Bonwon; Lee, Sangyun is a Engineering article available to read on EtoBox.
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- Author
- Kwon, Jang-Yeon; Jung, Ji Sim; Son, Kyoung Seok; Lee, Kwang-Hee; Park, Joon Seok; Kim, Tae Sang; Park, Jin-Seong; Choi, Rino; Jeong, Jae Kyeong; Koo, Bonwon; Lee, Sangyun
- Publisher
- The Electrochemical Society; Electrochemical Society, Inc. (ISSN 0013-4651)
- Published
- 2011
- Field
- Engineering (Physical Sciences)