About this scholarly article

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XI - Decoupling sparse coding of SIFT descriptors for large-scale visual recognition by Ji, Zhengping; Theiler, James; Chartrand, Rick; Kenyon, Garrett; Brumby, Steven P.; Szu, Harold H. is a scholarly article available to read on EtoBox.

Author

Ji, Zhengping; Theiler, James; Chartrand, Rick; Kenyon, Garrett; Brumby, Steven P.; Szu, Harold H.

Publisher

SPIE

Published

2013