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Local variability in PTC thermistor grain boundary structures by C. Leach; J. Seaton is a Engineering article available to read on EtoBox.

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## Abstract Scanning electron microscopy‐based conductive mode (CM) microscopy, using the remote electron beam‐induced current configuration, was carried out on a positive temperature coefficient of resistance thermistor at temperatures below and above the Curie temperature, __T__~C~. Below __T__~C~, when the thermistor is in a low resistance state, no strong CM contrast was observed. Above __T__~C~ the thermistor grain boundaries become highly resistive and significant CM contrast formed owing to three mechanisms: all of the areas that were studied showed resistive contrast, but in addition some grain boundaries showed additional contrast due to electron beam‐induced current, the origin of which was consistent with the presence of a back‐to‐back Schottky barrier structure at the grain boundary. Other grain boundaries exhibited additional contrast owing to __β__‐conductivity, which suggests a slightly different n‐i‐n grain boundary structure at these interfaces. These results suggest that electrically active grain boundaries with different structures coexist within the thermistor. SCANNING 30: 339–346, 2008. © 2008 Wiley Periodicals, Inc.

Who reads Local variability in PTC thermistor grain boundary structures?

Author

C. Leach; J. Seaton

Publisher

Hindawi Limited; Wiley (ISSN 0161-0457)

Published

2008

Language

EN

Field

Engineering (Physical Sciences)