About this scholarly article

2017 IEEE 21st Workshop on Signal and Power Integrity (SPI) - Simultaneous switching noise modelling and characterization in production environments by Yan, John; Tretiakov, Yuri; Lan, Hai is a scholarly article available to read on EtoBox.

Author

Yan, John; Tretiakov, Yuri; Lan, Hai

Publisher

IEEE

Published

2017