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About this Engineering article
Evidence for misfit dislocation-related carrier accumulation at the InAs/GaP heterointerface by Gopal, V.; Kvam, E. P.; Chin, T. P.; Woodall, J. M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Gopal, V.; Kvam, E. P.; Chin, T. P.; Woodall, J. M.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1998
- Language
- EN
- Field
- Engineering (Physical Sciences)
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