About this scholarly article

1975 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A lumped-modeling approach for TRAPATT diodes and external circuit analysis by Obah, C.; Mitchell, R.; Penstone, S. is a scholarly article available to read on EtoBox.

Author

Obah, C.; Mitchell, R.; Penstone, S.

Publisher

Institute of Electrical and Electronics Engineers

Published

1975